Skip to main content

Sample preparation kit for Leica electron microscopy EM TXP and Leica EM TIC 3X

DEVICE IS FOR:
Mechanical milling machine and polisher with diamond tools and ion-cutter with three argon ion bundles
CONTACT:
  • prof. Ing. et . Ing. Ivo Kuřitka, Ph.D. et Ph.D.
  • +420 57 603 8049
  • A418
  • This email address is being protected from spambots. You need JavaScript enabled to view it.

  • research
MECHANICAL OPERATIONS, MIXING

© UTB CPS

Web supplier: Weboo Marketing & Technology