Atomic Force Microscope Dimension ICON

Device intended for topographic characterization and surface analysis of materials. Atomic Force Microscope provides following options: Microscope scans with tip and is able to accommodate large samples (up to 210 mm diameter and 15 mm thickness) Position noise in „closed-loop" regime is lower than 0.15nm RMS Microscope controller allows simultaneous collection of data from 8 bands, resolution 5Mpix AFM modes: ScanAsyst, PeakForce Tapping, TappingMode (air), Contact Mode, Lateral Force Microscopy, PhaseImaging, Lift Mode, MFM, Force Spectroscopy, Force Volume, EFM, Surface Potential, Piezoresponse Microscopy Microscope allows nanoindentation measurement with diamond pin.