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Hall effect measuring system Linseis L79/HCS

DEVICE IS FOR:
The L79/HCS system enables the characterization of semiconductor elements by measuring: mobility, resistivity, charge carrier concentration and Hall coefficient.
CONTACT:
  • prof. Ing. Petr Slobodian, Ph.D.
  • +420 57 603 1350
  • A322
  • This email address is being protected from spambots. You need JavaScript enabled to view it.

  • research
ELECTRIC AND MAGNETIC PROPERTIES OF MATERIALS

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