Table SEM

Desktop scanning electron microscope Phenom Pro is eqquiped with high-sensitivity backscattered electron detector (both compositional and topographical modes) and a high brightness source. The zoom functionality of a state-of-the-art color navigation camera and extremely low sample loading time (light optical 5 s, electron optical 30 s) narrows the gapbetween optical and SEM imaging. It offers wide magnification range (light optical 20-135x, electron optical 20-130000x) at acceleration voltage 5 or 10 kV. Charge reduction sample holder enables imaging of non-conductive samples such as paper, polymers, organic aterials, ceramics, glass and coatings without troubles. Maximum sample size up to 32 mm (Ø) and 30 mm (h). Optional application system ProSuite enables automated image mapping and 3D roughness.